Specification
TS-C2400 Parameter Table |
|
Reference Distance |
9mm |
Measurement Range |
±1.2mm |
Measurement Angle |
±60° |
Beam Diameter |
Φ5.5μm/11μm/88μm |
Static Noise |
45nm |
Linearity Error |
<±0.48μm |
Minimum Measurable Thickness |
5%of F.S. |
Temperature Characteristic |
<0.03%of F.S./℃ |
Enclosure Protection Level |
IP40 |
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