Specification
TS-C4000N Parameter Table |
|
Reference Distance |
14.5mm |
Measurement Range |
±2mm |
Measurement Angle |
±21° |
Beam Diameter |
Φ12μm/24μm/192μm |
Static Noise |
100nm |
Linearity Error |
<±0.8μm |
Minimum Measurable Thickness |
5%of F.S. |
Temperature Characteristic |
<0.03%of F.S./℃ |
Enclosure Protection Level |
IP40 |
Weight |
238g |
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