Why It Matters

In CMOS image sensor manufacturing, the precise alignment and height of individual components—such as lens holders, filters, and sensor chips—play a crucial role in ensuring image quality and performance. Inaccurate height or tilt during assembly can lead to focus drift, optical aberrations, or even sensor failure. Therefore, accurate non-contact height measurement is essential to maintain tight tolerances and improve production efficiency.

Common Measurement Methods

Measurement Principle & Procedure

Chromatic Confocal Displacement Sensors (like TS-C Series) utilize chromatic dispersion to determine height by detecting the focal wavelength of reflected light. Each wavelength focuses at a different height, and the peak signal corresponds to the surface position.

Steps:

1. Mount the CMOS unit on a precision platform.

2. Scan across target components (e.g., lens holder, sensor die).

3. Collect height data for multiple points.

4. Analyze parallelism and height difference to ensure assembly standards.

This method is ideal for micron-level control and real-time feedback in high-volume production lines.

TronSight’s Solution

TronSight’s TS-C series chromatic confocal sensors offer superior vertical resolution (up to 5 nm) and high sampling rates (up to 30 kHz), enabling accurate inspection of component heights, step profiles, and flatness in CMOS sensor modules.

Advantages:

• Works with various transparent and reflective materials

• Immune to ambient light interference

• High precision for multilayer structures

Recommended Product

👉 TS-C Series Chromatic Confocal Displacement Sensor
Accurate, stable, and contactless measurement for semiconductor and optical applications.