Aug 15, 2025
In modern electronics manufacturing, the mounting height of chips directly affects the performance, reliability, and appearance of the final product.
Performance stability: Incorrect height can lead to poor solder joint connections, increasing the risk of electrical failure.
Production efficiency: Accurate height control reduces rework, improving throughput.
Quality assurance: Meeting strict IPC standards ensures product competitiveness in high-end markets such as automotive, aerospace, and medical devices.
Measurement Method | Principle | Advantages | Limitations |
---|---|---|---|
Contact-type probe measurement | Physical probe touches the surface | Simple structure, low cost | Risk of damaging chips; slow speed; not suitable for soft/fragile surfaces |
Laser triangulation | Measures displacement via light angle | Non-contact, relatively fast | Limited accuracy on reflective or transparent surfaces |
Vision measurement | Uses camera image analysis | Easy integration; can inspect multiple points at once | Accuracy affected by lighting; difficulty with transparent layers |
Chromatic confocal measurement | Analyzes wavelength shift from multi-spectrum light | High precision; works on transparent, reflective, and curved surfaces; no damage to target | Higher cost; requires proper alignment |
Chromatic confocal displacement sensors use broad-spectrum light and a wavelength analysis principle:
Step 1: White light passes through a chromatic lens, splitting into different wavelengths along the optical axis.
Step 2: Only the wavelength in focus on the target surface is reflected back into the sensor.
Step 3: The spectrometer detects the peak wavelength, which is then converted into a precise height value.
Advantages in chip mounting height measurement:
Non-contact measurement avoids physical damage.
Compatible with transparent chip surfaces, solder pads, and even multi-layer structures.
High-speed sampling up to 32kHz enables inline inspection in SMT production lines.
The TronSight TS-C Series Chromatic Confocal Displacement Sensor offers:
Up to 32kHz sampling rate with 16-channel fully synchronous acquisition(some modles).
EtherCAT compatibility for seamless integration into automated production lines.
Wide probe variety — maximum measuring angle ±60°, minimum probe diameter 3.8mm, adaptable to high-temperature and vacuum environments.
Multi-layer measurement capability for chips with transparent encapsulation or coatings.
Application example:
In an SMT line, the TS-C sensor is mounted on a precision stage above the PCB. As the PCB moves into position, the sensor measures each chip’s mounting height in real time, automatically flagging deviations from the tolerance range. This ensures consistent assembly quality without slowing down production.
Recommended Model: TS-C Series Chromatic Confocal Displacement Sensor
Measurement range: up to ±60°
Probe options: down to 3.8mm diameter
Special environments: high temperature, vacuum
Sampling speed: up to 32kHz, 16-channel synchronous
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Email: service@tronsight.com
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